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Fig. 1

X-ray diffraction pattern of CNT sintered at 1625 °C.
X-ray diffraction pattern of CNT sintered at 1625 °C.

Fig. 2

Secondary electron SEM micrograph of CNT sintered at 1625 °C.
Secondary electron SEM micrograph of CNT sintered at 1625 °C.

Fig. 3

Temperature dependence of ∊r and tanδ of CNT sample measured at different frequencies.
Temperature dependence of ∊r and tanδ of CNT sample measured at different frequencies.

Fig. 4

P-E hysteresis loop of CNT sample.
P-E hysteresis loop of CNT sample.

Fig. 5

(a) Plot of real part Z´ vs. imaginary part −Z˝ of the complex impedance Z* (b) spectroscopic plot of Z˝ and log f at different temperatures.
(a) Plot of real part Z´ vs. imaginary part −Z˝ of the complex impedance Z* (b) spectroscopic plot of Z˝ and log f at different temperatures.

Fig. 6

Spectroscopic plots of impedance Z˝ and modulus M˝ at temperatures (a) 744 °C (b) 782 °C and (c) 800 °C.
Spectroscopic plots of impedance Z˝ and modulus M˝ at temperatures (a) 744 °C (b) 782 °C and (c) 800 °C.

Fig. 7

Plots of frequency dependence of capacitance of grain and grain boundary regions at different temperatures.
Plots of frequency dependence of capacitance of grain and grain boundary regions at different temperatures.

The volumetric ratios of chemical compositions.

TiEthanolAcetic acidHNO3H2O
20 %80 %6 %3 %3 %

Values of R and C extracted from Z˝max and from M˝max.

Temp. [°C]Rgb [kW]Cgb [pF]Rg [kW]Cg [pF]
Extractedfrom Z˝maxExtractedfrom M˝max
74492.1313.7235.0805.71
78273.8213.5728.1335.70
80051.0312.4122.1905.66

EDX data of CNT sample sintered at 1625 °C.

ElementsCa [wt.%]Ti [wt.%]Nd [wt.%]
Grain (A)7.229.163.7
Grain (B)7.930.361.7
Grain (C)7.429.862.8
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