Three-Dimensional Image Measurement by Pattern Projection Using a Single Observation Image
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30. Dez. 2015
Über diesen Artikel
Online veröffentlicht: 30. Dez. 2015
Seitenbereich: 29 - 45
DOI: https://doi.org/10.1515/cait-2015-0065
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© 2015 Ke Sun et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Sun, Ke
Lu, Cunwei