Ohmic Contacts to p-GaN Using Au/Ni-Zn-O Metallization

FAN, Z. et al: Appl. Phys. Lett. 68 (1996), 1672.10.1063/1.115901Search in Google Scholar

MURAKAMI, M. et al: Crit. Rev. in Solid State and Mater. Sci. 23 (1998), 1.10.1080/10408439891324167Search in Google Scholar

YOUN, D. H. et al: Jpn. J. Appl. Phys. Part 1, 37 (1998), 1768.10.1143/JJAP.37.1768Search in Google Scholar

CHEN, L. C. et al: Solid State Electron. 47 (2003), 1843.10.1016/S0038-1101(03)00129-1Search in Google Scholar

SONG, J. O. et al: Semicond. Sci. Technol. 19 (2004), 669.10.1088/0268-1242/19/6/001Search in Google Scholar

SONG J. O. et al: Appl. Phys. Lett. 83 (2004), 3513.10.1063/1.1622984Search in Google Scholar

SONG, J. O. et al: Appl. Phys. Lett. 84 (2004), 4663.10.1063/1.1759774Search in Google Scholar

CHAE, S. W. et al: J. Korean Phys. Soc. 49 (2006), 899.10.3345/kjp.2006.49.9.991Search in Google Scholar

HO, J. K. et al: Appl. Phys. Lett. 74 (1999), 1275.10.1063/1.123546Search in Google Scholar

HO, J. K. et al: J. Appl. Phys. 86 (1999), 4491.10.1063/1.371392Search in Google Scholar

KOIDE, Y. et al: J. Electron. Mater. 28 (1999), 341.10.1007/s11664-999-0037-7Search in Google Scholar

MISTELE, D. et al: J. Cryst. Growth 230 (2001), 564.10.1016/S0022-0248(01)01250-7Search in Google Scholar

CHEN, L. C. et al: J. Appl. Phys. 76 (2000), 3703.10.1063/1.126755Search in Google Scholar

JANG, H. W. et al: J. Appl. Phys. 94 (2003), 1748.Search in Google Scholar

EENZEL, R. et al: Mater. Sci. Semicond. Process. 0 (2000), 1.Search in Google Scholar

PARK, M. R. et al: ETRI Journ. 24 (2002), 349.10.4218/etrij.02.0102.0503Search in Google Scholar

NARAYAN, J. et al: Appl. Phys. Lett. 81 (2002), 3978.10.1063/1.1524032Search in Google Scholar

WANG, S. H. et al: J. Appl. Phys. 91 (2002), 3711.10.1063/1.1453355Search in Google Scholar

LIDAY, J. et al: Appl. Surf. Sci. 253 (2007), 3174.10.1016/j.apsusc.2006.07.011Search in Google Scholar

LIDAY, J. et al: J. Electrical Engin. 61 (2010), 374.10.2478/v10187-010-0009-4Search in Google Scholar