1. bookVolume 10 (2010): Issue 6 (December 2010)
Journal Details
License
Format
Journal
eISSN
1335-8871
First Published
07 Mar 2008
Publication timeframe
6 times per year
Languages
English
access type Open Access

Frequency Selection of Sine Wave for Dynamic ADC Test

Published Online: 20 Jan 2011
Volume & Issue: Volume 10 (2010) - Issue 6 (December 2010)
Page range: 205 - 208
Journal Details
License
Format
Journal
eISSN
1335-8871
First Published
07 Mar 2008
Publication timeframe
6 times per year
Languages
English
Frequency Selection of Sine Wave for Dynamic ADC Test

The paper deals with determination of an optimum frequency for the time domain and frequency domain ADC testing. Proposed algorithm for selection of test signal frequency fulfills two common requirements. The first requirement is to get maximum quantity of distinct phases of the sampled values which are uniformly distributed between 0 and 2π; the second one is to avoid overlapping of higher harmonic components aliased in the first Nyquist zone. The algorithm was verified using MATLAB simulations and practical measurements.

Keywords

IEEE Standards (2000). IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters. IEEE Std 1241-2000.Search in Google Scholar

IEEE Standards (2007). IEEE Standard for Digitizing Waveform Recorders. IEEE Std 1957-2007. (Revision of IEEE Std 1057-1994).Search in Google Scholar

Blair, J. J. (2005). Selecting test frequencies for sinewave tests of ADCs. IEEE Transactions On Instrumentation And Measurement, 54 (1), 73-78.10.1109/TIM.2004.838913Search in Google Scholar

Carbone, P., Petri, D. (2000). Effective frequency-domain ADC testing. IEEE Transactions On Circuits and Systems, 47 (7), 660-663.10.1109/82.850425Search in Google Scholar

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