1. bookVolume 10 (2010): Issue 6 (January 2010)
Journal Details
License
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Journal
eISSN
1335-8871
First Published
07 Mar 2008
Publication timeframe
6 times per year
Languages
English
Open Access

Frequency Selection of Sine Wave for Dynamic ADC Test

Published Online: 20 Jan 2011
Volume & Issue: Volume 10 (2010) - Issue 6 (January 2010)
Page range: 205 - 208
Journal Details
License
Format
Journal
eISSN
1335-8871
First Published
07 Mar 2008
Publication timeframe
6 times per year
Languages
English

IEEE Standards (2000). IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters. IEEE Std 1241-2000.Search in Google Scholar

IEEE Standards (2007). IEEE Standard for Digitizing Waveform Recorders. IEEE Std 1957-2007. (Revision of IEEE Std 1057-1994).Search in Google Scholar

Blair, J. J. (2005). Selecting test frequencies for sinewave tests of ADCs. IEEE Transactions On Instrumentation And Measurement, 54 (1), 73-78.10.1109/TIM.2004.838913Search in Google Scholar

Carbone, P., Petri, D. (2000). Effective frequency-domain ADC testing. IEEE Transactions On Circuits and Systems, 47 (7), 660-663.10.1109/82.850425Search in Google Scholar

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