1. bookVolume 30 (2012): Issue 2 (June 2012)
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
access type Open Access

The effect of processing conditions on the phase, microstructure and dielectric properties of SrCa4Nb4TiO17 and Ca5Nb4TiO17 microwave ceramics

Published Online: 18 Jul 2012
Volume & Issue: Volume 30 (2012) - Issue 2 (June 2012)
Page range: 98 - 104
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

The effect of processing conditions on the phase, microstructure and dielectric properties of SrCa4Nb4TiO17 and Ca5Nb4TiO17 microwave ceramics was investigated. The ceramics processed via solid state mixed-oxide route were characterized using XRD, Raman spectroscopy and SEM for phase, molecular vibrational modes and microstructural analysis respectively. Dielectric properties at low and microwave frequencies were measured using LCR meter and a vector network analyzer. The XRD results revealed the formation of a single phase for each ceramics. The microstructure was comprised of elongated and plate-like grains. The optimum microwave dielectric properties i.e. temperature coefficient of resonant frequency (τf) ∼ −78 ppm/K, electric permittivity (ɛr) ∼47.2 and quality factor multiplied by the resonant frequency (Q u f o) ∼11954 GHz, were achieved for SrCa4Nb4TiO17, sintered at 1475 °C for 4 h. For Ca5Nb4TiO17, sintered at 1450 °C for 4 h, the respective properties were: τf ∼ −137 ppm/K, ɛr ∼ 42 and Q u f o ∼ 14800 GHz respectively.

Keywords

[1] Nedelcu L., Toacsan M.I., Banciu M.G., Loachim A., J. Alloys. Compd., 509 (2011), 477. http://dx.doi.org/10.1016/j.jallcom.2010.09.06910.1016/j.jallcom.2010.09.069Search in Google Scholar

[2] Ohsato H., J. Ceram. Soc. Jap., 113(11) (2005), 703. http://dx.doi.org/10.2109/jcersj.113.70310.2109/jcersj.113.703Search in Google Scholar

[3] Freer R., Azough F., J. Euro. Ceram. Soc., 28 (2008), 1433. http://dx.doi.org/10.1016/j.jeurceramsoc.2007.12.00510.1016/j.jeurceramsoc.2007.12.005Search in Google Scholar

[4] Reaney I.M., Idles D., J. Am. Ceram. Soc., 89(7) (2006), 2068. Search in Google Scholar

[5] Sebatian M.T., Dielectric Materials for Wireless Communication, Elsevier LTD, 2008. Search in Google Scholar

[6] Jawahar I.N. Santha N. Sebastian M.T., Mohanan P., J. Mater. Res., 17 (2002), 3084. http://dx.doi.org/10.1557/JMR.2002.044610.1557/JMR.2002.0446Search in Google Scholar

[7] Fei Z. Zhenxing Y. Zhilun G., Longtu L., J. Am. Ceram. Soc., 89(11) (2006), 3421. http://dx.doi.org/10.1111/j.1551-2916.2006.01236.x10.1111/j.1551-2916.2006.01236.xSearch in Google Scholar

[8] Chen Y.C., Tsai J.M., JPN. J. APPL. PHYS., 47 (2008), 7959. http://dx.doi.org/10.1143/JJAP.47.795910.1143/JJAP.47.7959Search in Google Scholar

[9] Chen Y.C., Yao S.L., Chen R.J., K.C., J. Alloys. Compd., 486 (2009), 410. http://dx.doi.org/10.1016/j.jallcom.2009.06.18910.1016/j.jallcom.2009.06.189Search in Google Scholar

[10] Iqbal Y., Manan A., Reaney I.M., Mater. Res. Bull., 46(7) (2011), 1092. http://dx.doi.org/10.1016/j.materresbull.2011.03.00210.1016/j.materresbull.2011.03.002Search in Google Scholar

[11] Manan A., Iqbal Y., J. Mater. Sci. Mater. Electron., 22(12) (2011), 1848. http://dx.doi.org/10.1007/s10854-011-0372-310.1007/s10854-011-0372-3Search in Google Scholar

[12] Manan A., Iqbal Y., Qazi I., J. Mater. Sci., 46(10) (2011), 3415. http://dx.doi.org/10.1007/s10853-010-5230-910.1007/s10853-010-5230-9Search in Google Scholar

[13] Joseph T., Anjana P.S., Letourneau S., Ubic R., Smaalen S.V., Sebastian M.T., Mater. Chem. Phys., 121 (2010) 77. http://dx.doi.org/10.1016/j.matchemphys.2009.12.04610.1016/j.matchemphys.2009.12.046Search in Google Scholar

[14] Chen G.H., Di J.C., Xu H.R., Yang Y., Yuan C.L., Zhou C.R., Cheng J., Kiu X.Y., J. Mater. Sci. Mater. Electron., 23(1) (2012), 280. http://dx.doi.org/10.1007/s10854-011-0404-z10.1007/s10854-011-0404-zSearch in Google Scholar

[15] Ichinose N.T., Shimada, J. Euro. Ceram. Soc., 26 (2006), 1755. http://dx.doi.org/10.1016/j.jeurceramsoc.2005.09.03210.1016/j.jeurceramsoc.2005.09.032Search in Google Scholar

[16] Mcneal M.P., Jang S.J.R., Newnham E., J. Appl. Phys., 83(6) (1998), 3288. http://dx.doi.org/10.1063/1.36709710.1063/1.367097Search in Google Scholar

[17] Roulland F. Terras R., Marinel S., Mater. Sci. Eng. B., 104 (2003), 156. http://dx.doi.org/10.1016/S0921-5107(03)00189-210.1016/S0921-5107(03)00189-2Search in Google Scholar

[18] Tseng C.F., Huang C.L., Yang W.R., Hsu. C.H., J. Am. Ceram. Soc., 89(4) (2006), 1465. http://dx.doi.org/10.1111/j.1551-2916.2005.00910.x10.1111/j.1551-2916.2005.00910.xSearch in Google Scholar

[19] Kan A., Ogawa H., Ohsato H., J. Alloys. Compd., 337 (2002), 303. http://dx.doi.org/10.1016/S0925-8388(01)01950-810.1016/S0925-8388(01)01950-8Search in Google Scholar

[20] Fang Y., Hu A., Ouyang S., Oh J.J., J. Euro. Ceram. Soc., 21 (2001), 2745. http://dx.doi.org/10.1016/S0955-2219(01)00356-910.1016/S0955-2219(01)00356-9Search in Google Scholar

[21] Oishi T., Ogawa H., Kan A., Mater. Res. Bull., 42 (2007), 2072. http://dx.doi.org/10.1016/j.materresbull.2007.01.01410.1016/j.materresbull.2007.01.014Search in Google Scholar

[22] Negas T., Yeager G., Bell S., Coates N., Minis I., Am. Ceram. Soc. Bull., 72 (1993), 80. Search in Google Scholar

[23] Deshpande V.V., Patil M.M., Ravi V., Ceram. Inter., 32(3) (2006), 353. http://dx.doi.org/10.1016/j.ceramint.2005.03.00510.1016/j.ceramint.2005.03.005Search in Google Scholar

[24] Krupka J., Derzakowski K., Riddle B., Bakerjarvis J., Meas. Sci. Technol., 9 (1998), 1751. http://dx.doi.org/10.1088/0957-0233/9/10/01510.1088/0957-0233/9/10/015Search in Google Scholar

[25] Sinton C.W., Raw materials for glass and ceramics sources, processes and quality control, John Willey & Son Inc, 2006, p. 151–160. Search in Google Scholar

[26] Manan A., Iqbal Y., Qazi I., J. Pak. Mater. Soc., 2(2) (2008), 77. Search in Google Scholar

[27] Shannon R.D., Acta. Cryst. A., 32 (1976) 751. http://dx.doi.org/10.1107/S056773947600155110.1107/S0567739476001551Search in Google Scholar

[28] Ratheesh R., Sreemoolanadhan H., Sebastian M.T., J. Solid. State. Chem., 131 (1997), 2. http://dx.doi.org/10.1006/jssc.1996.724010.1006/jssc.1996.7240Search in Google Scholar

[29] Titov Y.A., Belyavina N.M., Markive V.Y., Slobodyanik M.S., Chumak V.V., J. Alloys. Compds., 387 (2005) 82. http://dx.doi.org/10.1016/j.jallcom.2004.06.03210.1016/j.jallcom.2004.06.032Search in Google Scholar

[30] Hao H., Liu H.X., Cao M.H., Min X.M., Ouyang S.X., Appl. Phys. A., 85 (2006), 69. http://dx.doi.org/10.1007/s00339-006-3651-810.1007/s00339-006-3651-8Search in Google Scholar

[31] Zheng H. et al., J. Mater. Res., 19 (2004) 488. http://dx.doi.org/10.1557/jmr.2004.19.2.48810.1557/jmr.2004.19.2.488Search in Google Scholar

[32] Hirata T., Ishioka K.M., Kitajima, J. Solid. State. Chem., 124 (1996), 353. http://dx.doi.org/10.1006/jssc.1996.024910.1006/jssc.1996.0249Search in Google Scholar

[33] Fang L., Diao C.L., Zhang H., Yoan R.Z., Dronskowski R., Liu H.X., J. Mater. Sci. Mater. Electron., 15 (2004), 803. http://dx.doi.org/10.1023/B:JMSE.0000045303.12402.0810.1023/B:JMSE.0000045303.12402.08Search in Google Scholar

[34] Shannon R.D., J. Appl. Phys., 73 (1993), 348. http://dx.doi.org/10.1063/1.35385610.1063/1.353856Search in Google Scholar

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