Open Access

Study on etching anisotropy of Si(hkl) planes in solutions with different KOH and isopropyl alcohol concentrations

 and    | May 08, 2012

Cite

[1] PUERS B. and SANSEN W., Sens. Actuators, A, 23 (1990), 1036. http://dx.doi.org/10.1016/0924-4247(90)87085-W10.1016/0924-4247(90)87085-WSearch in Google Scholar

[2] ZUBEL I. and KRAMKOWSKA M., Sens. Actuators, A, 93 (2001), 138. http://dx.doi.org/10.1016/S0924-4247(01)00648-310.1016/S0924-4247(01)00648-3Search in Google Scholar

[3] ZUBEL I, Sens. Actuators, A, 94 (2001), 76–86. http://dx.doi.org/10.1016/S0924-4247(01)00690-210.1016/S0924-4247(01)00690-2Search in Google Scholar

[4] ZUBEL I. and KRAMKOWSKA M., Surf. Sci., 602 (2008), 1712. http://dx.doi.org/10.1016/j.susc.2008.03.01010.1016/j.susc.2008.03.010Search in Google Scholar

[5] ROLA K.P. and ZUBEL I., Cent. Eur. J. Phys., 9 (2011), 410. http://dx.doi.org/10.2478/s11534-010-0114-910.2478/s11534-010-0114-9Search in Google Scholar

[6] HYLTON J.D., BURGERS A.R. and SINKE W.C., J. Electrochem. Soc., 151 (2004), G408. http://dx.doi.org/10.1149/1.173813710.1149/1.1738137Search in Google Scholar

[7] ZUBEL I. and KRAMKOWSKA M., J. Microelectromech. Syst., 16 (2007), 1411. http://dx.doi.org/10.1109/JMEMS.2007.90875310.1109/JMEMS.2007.908753Search in Google Scholar

[8] ZUBEL I. and KRAMKOWSKA M., J. Micromech. Microeng., 15 (2005), 485. http://dx.doi.org/10.1088/0960-1317/15/3/00810.1088/0960-1317/15/3/008Search in Google Scholar

[9] RESNIK D., VRTACNIK D. and AMON S., J. Micromech. Microeng., 10 (2000), 430. http://dx.doi.org/10.1088/0960-1317/10/3/31910.1088/0960-1317/10/3/319Search in Google Scholar

[10] XU Y.W., MICHAEL A. and KWOK C.Y., Sens. Actuators, A, 166 (2011), 164. http://dx.doi.org/10.1016/j.sna.2010.12.01810.1016/j.sna.2010.12.018Search in Google Scholar

[11] ZUBEL I. and ROLA K., Opt. Appl., 41 (2011), 423. Search in Google Scholar

[12] PAL P., SATO K., GOSALVEZ M.A., KIMURA Y., ISHIBASHI K-I., NIWANO M., HIDA H., BIN TANG and ITOH S., J. Microelectromech. Syst., 18 (2009), 1345. http://dx.doi.org/10.1109/JMEMS.2009.203168810.1109/JMEMS.2009.2031688Search in Google Scholar

[13] ZUBEL I. and KRAMKOWSKA M., Acta Phys. Pol., A, 116 (2009), s105. 10.12693/APhysPolA.116.S-105Search in Google Scholar

[14] SEIDEL H., CSEPREGI L., HEUBERGER A. and BAUMGÄRTEL H., J. Electrochem. Soc., 137 (1990), 3612. http://dx.doi.org/10.1149/1.208627710.1149/1.2086277Search in Google Scholar

[15] ZUBEL I., ROLA K. and KRAMKOWSKA M., Sens. Actuators, A, 171 (2011), 436. http://dx.doi.org/10.1016/j.sna.2011.09.00510.1016/j.sna.2011.09.005Search in Google Scholar

[16] GOSALVEZ M.A., SATO K., FOSTER A.S., NIEMINEN R.M. and TANAKA H., J. Micromech. Microeng., 17 (2007), S1. http://dx.doi.org/10.1088/0960-1317/17/4/S0110.1088/0960-1317/17/4/S01Search in Google Scholar

eISSN:
2083-124X
ISSN:
2083-1331
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties