Cite

Sichen Fan
National Time Service Center, Chinese Academy of ScienceChina
University of Chinese Academy of Science, Beijing, China
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Jun Ruan
National Time Service Center, Chinese Academy of ScienceChina
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Dandan Liu
National Time Service Center, Chinese Academy of ScienceChina
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Xinliang Wang
National Time Service Center, Chinese Academy of ScienceChina
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Fan Yang
National Time Service Center, Chinese Academy of ScienceChina
University of Chinese Academy of Science, Beijing, China
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Yong Guan
National Time Service Center, Chinese Academy of ScienceChina
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Hui Zhang
National Time Service Center, Chinese Academy of ScienceChina
University of Chinese Academy of Science, Beijing, China
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Junru Shi
National Time Service Center, Chinese Academy of ScienceChina
University of Chinese Academy of Science, Beijing, China
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Yang Bai
National Time Service Center, Chinese Academy of ScienceChina
University of Chinese Academy of Science, Beijing, China
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
Shougang Zhang
National Time Service Center, Chinese Academy of ScienceChina
Key Laboratory of Time and Frequency Primary Standards, Chinese Academy of Science China
eISSN:
1335-8871
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing