Open Access

Resonance Micro-Weighing of Sub-Picogram Mass with the Use of Adaptive Interferometer


Cite

[1] Wilkening, G., Koenders, L. (Eds.). (2005). Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro and Nanometer Range. John Wiley & Sons.10.1002/3527606661Search in Google Scholar

[2] Carr, D.W., Evoy, S., Sekaric, L., Craighead, H.G., Parpia, J.M. (1999). Measurement of mechanical resonance and losses in nanometer scale silicon wires. Applied Physics Letters, 75 (7), 920-922.10.1063/1.124554Search in Google Scholar

[3] Gupta, S.V. (2008). Nano-technology for detection of small mass difference. MAPAN - Journal Metrology Society of India, 23 (3), 177-192.Search in Google Scholar

[4] Ilic, B., Craighead, H.G., Krylov, S., Senaratne, W., Ober, C., Neuzil, P. (2004). Attogram detection using nanoelectromechanical oscillators. Journal of Applied Physics, 95 (7), 3694-3703.10.1063/1.1650542Search in Google Scholar

[5] Singamaneni, S., LeMieux, M.C., Lang, H.P., Gerber, C., Lam, Y., Zauscher, S., Tsukruk, V.V. (2008). Bimaterial microcantilevers as a hybrid sensing platform. Advanced Materials, 20 (4), 653-680.10.1002/adma.200701667Search in Google Scholar

[6] Shandarov, S.M., Burimov, N.I., Kulchin, Y.N., Romashko, R.V., Tolstik, A.L., Shepelevich, V.V.E. (2008). Dynamic Denisyuk holograms in cubic photorefractive crystals. Quantum Electronics, 38 (11), 1059-1069.10.1070/QE2008v038n11ABEH013793Search in Google Scholar

[7] Kamshilin, A.A., Romashko, R.V., Kulchin, Y.N. (2009). Adaptive interferometry with photorefractive crystals. Journal of Applied Physics, 105 (3), 031101.10.1063/1.3049475Search in Google Scholar

[8] Romasko, R.V., Kulchin, Y.N., Kamshilin, A.A. (2010). 3D-ortogonal three-wave mixing in adaptive interferometry. Pacific Science Review, 11 (5), 136-138.Search in Google Scholar

[9] Romashko, R.V., Kulchin, Y.N., Kamshilin, A.A. (2011). Polarization-Insensitive Adaptive interferometer based on orthogonal three-wave mixing in photorefractive crystal. Pacific Science Review, 13 (3), 252-254.Search in Google Scholar

eISSN:
1335-8871
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing