<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The work presents a physical model of trap-assisted tunnelling that allows assessing the impact of traps upon the total current through metal/semiconductor heterostructures. The model is based on expressing the occupation probability of the trapping centres by electrons in terms of thermal and tunnelling capture and emission times, commonly referred to as exchange times. The occupation probabilities calculated in this way are then used to evaluate the generation-recombination rates occurring in the continuity equations.</p></abstract>

The work presents a physical model of trap-assisted tunnelling that allows assessing the impact of traps upon the total current through metal/semiconductor heterostructures. The model is based on expressing the occupation probability of the trapping centres by electrons in terms of thermal and tunnelling capture and emission times, commonly referred to as exchange times. The occupation probabilities calculated in this way are then used to evaluate the generation-recombination rates occurring in the continuity equations.

Deriving the exchange times for a model of trap-assisted tunnelling

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

{"article-title":"Deriving the exchange times for a model of trap-assisted tunnelling"}

The work presents a physical model of trap-assisted tunnelling that allows assessing the impact of traps upon the total current through metal/semiconductor...

Deriving the exchange times for a model of trap-assisted tunnelling

Published Online: Mar 20, 2020

Page range: 31 - 36

Received: Dec 09, 2019

DOI: https://doi.org/10.2478/jee-2020-0004

Keywords
trap-assisted tunnelling, capture and emission probability, exchange times

© 2020 Juraj Racko et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Deriving the exchange times for a model of trap-assisted tunnelling

Published Online: Mar 20, 2020

Page range: 31 - 36

Received: Dec 09, 2019

DOI: https://doi.org/10.2478/jee-2020-0004

Keywordstrap-assisted tunnelling, capture and emission probability, exchange times

© 2020 Juraj Racko et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Keywords
trap-assisted tunnelling, capture and emission probability, exchange times