Cite

Figure 1

(a) paper B, in field 75.10 (also 75.30, 75.40, and 75.50) and from Japan, is cited by paper A, in field 75.10 (also 75.30) and from the USA, German and Japan. (b) Citations (from A to B and from A to C) are converted into a citation network among the countries × subfields of physics.
(a) paper B, in field 75.10 (also 75.30, 75.40, and 75.50) and from Japan, is cited by paper A, in field 75.10 (also 75.30) and from the USA, German and Japan. (b) Citations (from A to B and from A to C) are converted into a citation network among the countries × subfields of physics.

Figure 2

The direct citations are shown on a world map. For each node c, we show the number of received citations and the calculated IOF, SIOc$S_{IO}^{c}$. On each edge eji$e_{j}^{i}$ on the world map, we code with the thickness of the line the value of both xji$x_{j}^{i}$ and xij:xji$x_{i}^{j}:x_{j}^{i}$ is the line near i and xji$x_{j}^{i}$ is the line near j. Each edge is also color-coded: the line starting from i is red when xij>xji$x_{i}^{j}>x_{j}^{i}$ and green otherwise.
The direct citations are shown on a world map. For each node c, we show the number of received citations and the calculated IOF, SIOc$S_{IO}^{c}$. On each edge eji$e_{j}^{i}$ on the world map, we code with the thickness of the line the value of both xji$x_{j}^{i}$ and xij:xji$x_{i}^{j}:x_{j}^{i}$ is the line near i and xji$x_{j}^{i}$ is the line near j. Each edge is also color-coded: the line starting from i is red when xij>xji$x_{i}^{j}>x_{j}^{i}$ and green otherwise.

Figure 3

The net influence rank of countries × subfields. Each country is represented by its flag. The ones with higher net influence rank than the direct rank are above the diagonal line, thus undercited, while they are under the diagonal line when their net influence ranks are lower, thus overcited.
The net influence rank of countries × subfields. Each country is represented by its flag. The ones with higher net influence rank than the direct rank are above the diagonal line, thus undercited, while they are under the diagonal line when their net influence ranks are lower, thus overcited.

Figure 4

(a) Percentage of undercited fields of each country are plotted in a figure of the number of undercited fields v.s. the number of contributed fields. More information than just the percentage of undercited fields can be seen from (b) the relative and absolute ranking difference between the net and the direct rank of each country c.
(a) Percentage of undercited fields of each country are plotted in a figure of the number of undercited fields v.s. the number of contributed fields. More information than just the percentage of undercited fields can be seen from (b) the relative and absolute ranking difference between the net and the direct rank of each country c.

Top 10 undercited or overcited subfields of USA and China.

USAChina
UnderCitedUnderCited
114.17Properties of specific particles12.25Models for gravitational interactions
291.67Geochemistry96.40Cosmic rays
325.38Properties of specific particles11.40Currents and their properties
466.46Quantum tunneling of defects42.66Physiological optics
526.10Nuclear astrophysics31.90Other topics in the theory of the electronic structure of atoms and molecules
623.70Heavy-particle decay93.30Information related to geographical regions
724.87Surrogate reactions51.35Mechanical properties; compressibility
891.80Geochronology34.60Scattering in highly excited states
995.80Astronomical catalogs, atlases, sky surveys, databases, retrieval systems, archives, etc.47.37Hydrodynamic aspects of superfluidity
1042.27Wave optics25.43Antiproton-induced reactions
OverCitedOverCited
168.25Phase transitions in liquid thin films43.80Bioacoustics
268.48Solid-gas/vacuum interfaces: types of surfaces91.65Geophysical aspects of geology, mineralogy, and petrology
353.35Other topics in physics of plasmas and electric discharges82.75Molecular sieves, zeolites, clathrates, and other complex solids
407.58Infrared, submillimeter wave, microwave and radiowave instruments and equipment28.50Fission reactor types
507.90Other topics in instruments, apparatus, and components common to several branches of physics and astronomy87.56Radiation therapy equipment
662.90Other topics in mechanical and acoustical properties of condensed matter35.80Atomic and molecular measurement
785.15Electronic and magnetic devices; microelectronics46.15Computational methods in continuum mechanics
868.40Chemisorption/physisorption: adsorbates on surfaces29.17Electrostatic, collective, and linear accelerators
901.50Educational aids85.40Microelectronics: LSI, VLSI, ULSI; integrated circuit fabrication technology
1025.50Photonuclear reactions84.30Electronic circuits
eISSN:
2543-683X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Computer Sciences, Information Technology, Project Management, Databases and Data Mining