Open Access

A Circuit Principle and Simulation Test for Negative Group Delay


Cite

Han Shen
School of Computer Science and Engineering, Xi'an Technological UniversityXi'an, China
Zhongsheng Wang
School of Computer Science and Engineering, Xi'an Technological UniversityXi'an, China
eISSN:
2470-8038
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Computer Sciences, other