1. bookVolume 23 (2018): Issue 2 (December 2018)
Journal Details
License
Format
Journal
First Published
08 Nov 2012
Publication timeframe
2 times per year
Languages
English
Copyright
© 2020 Sciendo
Journal Details
License
Format
Journal
First Published
08 Nov 2012
Publication timeframe
2 times per year
Languages
English
Copyright
© 2020 Sciendo

A number of PCB defects, though having passed successfully the defect identification procedure, can potentially grow into critical defects under the influence of various external and (or) internal influences. The complex nature of the development of defects leading to PCB failures demands developing and updating the data measuring systems not only for detection but also for the prediction of future development of PCB defects considering the external influences. To solve this problem, it is necessary to analyse the models of defect development, which will allow predicting the defect growth and working out the mathematical models for their studies.

Keywords

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