Open Access

The Enhancement of 3D Scans Depth Resolution Obtained by Confocal Scanning of Porous Materials


[1] Ficker, T., Len, A., Chmelík, R., Lovicar, L., Martišek, D., Němec, P. (2007). Fracture surfaces of porous materials. Europhysics Letters, 80 (6), 1600-1604. 10.1209/0295-5075/80/16002Search in Google Scholar

[2] Ficker, T., Martišek, D., Jennings, H.M. (2010). Roughness of fracture surfaces and compressive strength of hydrated cement pastes. Cement and Concrete Research, 40 (6), 947-955. 10.1016/j.cemconres.2010.02.002Open DOISearch in Google Scholar

[3] Ficker, T.,Martišek, D. (2012). Digital fracture surfaces and their roughness analysis: Applications to cementbased materials. Cement and Concrete Research, 42 (6), 827-833. 10.1016/j.cemconres.2012.03.007Open DOISearch in Google Scholar

[4] Van Kempen, G.M.P., Van Vliet, L.J., Verveer, P.J., Van Der Voort, H.T.M. (1997). A quantitative comparison of image restoration methods for confocal microscopy. Journal of Microscopy, 185, 354-365. 10.1046/j.1365-2818.1997.d01-629.xSearch in Google Scholar

[5] Kervrann, C., Trubuil, A. (2004). An adaptive window approach for Poisson noise reduction and structure preserving in confocal microscopy. In 2nd IEEE International Symposium on Biomedical Imaging: Nano to Macro, Arlington, VA, USA. IEEE, 788-791. 10.1109/ISBI.2004.1398656Search in Google Scholar

[6] Sheppard C.J.R., Shotton D.M. (1997) Confocal Laser Scanning Microscopy. Springer. Search in Google Scholar

[7] Martisek, D., Prochazkova, J., Ficker, T. (2015). Highquality three-dimensional reconstruction and noise reduction of multifocal images from oversized samples. Journal of Electronic Engineering, 24 (5). Search in Google Scholar

[8] Montgomery, D.C., Runger, G.C. (2003). Applied Statistics and Probability for Engineers, 3rd ed. John Wiley & Sons. Search in Google Scholar

[9] Yio, M.H.N., Mac, M.J., Wong, H.S., Buenfeld, N.R. (2015). 3D imaging of cement-based materials at submicron resolution by combining laser scanning confocal microscopy with serial sectioning. Journal of Microscopy, 258 (2), 151-169.10.1111/jmi.1222825651933Search in Google Scholar

Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing