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Investigation on growth, optical and thermal properties of stilbazolium derivative crystal: 4-N,N-dimethylamino-4′-N′-methylstilbazolium 2,4-dimethylbenzenesulfonate


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Synthesis scheme of DSDMS.
Synthesis scheme of DSDMS.

Solubility and nucleation curves of DSDMS.
Solubility and nucleation curves of DSDMS.

Photograph of as-grown DSDMS single crystal and its prominent planes drawn with WinX-Morph program.
Photograph of as-grown DSDMS single crystal and its prominent planes drawn with WinX-Morph program.

Powder XRD pattern of DSDMS.
Powder XRD pattern of DSDMS.

Infrared and FT-Raman spectra of DSDMS.
Infrared and FT-Raman spectra of DSDMS.

UV-Vis absorption spectrum of DSDMS.
UV-Vis absorption spectrum of DSDMS.

Plots of hardness number (Hv) and Meyer index (d) versus load P of DSDMS.
Plots of hardness number (Hv) and Meyer index (d) versus load P of DSDMS.

Plots of dielectric constant (a) and dielectric loss (b) vs. log f for DSDMS.
Plots of dielectric constant (a) and dielectric loss (b) vs. log f for DSDMS.

Plot of thermogravimetric (TG-DTA) analysis for DSDMS
Plot of thermogravimetric (TG-DTA) analysis for DSDMS

Infrared and Raman band positions and their assignments of DSDMS.

νIR [cm−1]νRaman [cm−1]Assignments
500C–CH3 out-of-plane bending mode
679S–O stretching
721C–C aromatic ring
775C–S strong band
1040, 1176C–S asymmetric stretching
1049S=O weak band
1164SO3 symmetric stretching
1180CH3 out-of-plane bending
1210C–N stretching vibration
1320C–CH3 stretching vibration
1345, 1373CH3 weak band (symmetric stretching vibration)
1400, 1650C–C stretching modes
1427, 1440CH3 weak band (asymmetric in plane)
1360, 2850C–H stretching and bending vibration of methyl group
1508C–N stretching
1544Aromatic / hetero-strong
1576C–C aromatic ring chain vibration
1579C=C aromatic ring
1600C=C stretching mode unconjugated alkene

Hardness parameters of DSDMS by using Vicker’s hardness test.

Load [g]Hv [kg-mm−2]Meyers index [n]C11 [GPa]σv [GPa]
1089.292.451.130.209
2599.362.452.390.313
50107.152.454.050.395
10092.502.451.440.309
eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties