This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Spectral characteristics of: (a) transmission and (b) reflection coefficients designed for Ag thin films with different thicknesses.Dependence of transmission and reflection coefficients on thin film thickness estimated for λ=550 nm.Transmission and reflection characteristics of 15 nm silver thin films deposited on glass by electron beam evaporation. Theoretical curves were designed using Film Star Design software.Temperature changes measured at the back surface of a reference and 15 nm Ag coated glass under exposition to heat radiation from quartz-halogen lamp.Transmission and reflection spectra of the 15 nm Ag thin film coating after exposition to heat radiation.SEM images of the surface of: a) as-deposited and b) annealed 15 nm Ag thin films prepared by electron beam evaporationEDS spectra of annealed Ag thin films taken from marked areas.AFM images taken at different magnifications for: a) as-deposited and b) heated Ag thin films.AFM analysis results: a) height distribution of grains size in Z direction and b) cross-section topography
of as-deposited and heated Ag thin films.XPS spectra of as-deposited and annealed Ag thin films: a) wide scan survey spectrum, b) Ag3d, c) O1s
and d) Si2p, Ag3s regions.