On Measurement Uncertainty of ADC Nonlinearities in Oscillation-Based Test

ARABI, K.—KAMINSKA, B.: Oscillation-Test Strategy for Analog and Mixed-Signal Circuits, Proc. VLSI Test Symposium yr1996, 476-482.Search in Google Scholar

ARABI, K.—KAMINSKA, B.: Design for Testability of Integrated Operational Amplifiers Using Oscillation-Test Strategy, Proc. ICCD (1996), 40-45.Search in Google Scholar

ARABI, K.—KAMINSKA, B.: Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method, IEEE Transactions on CAD 16 No. 7 (1997), 745-753.10.1109/43.644035Search in Google Scholar

HUERTAS, G.—VAZQUEZ, D.—RUEDA, A.—HUERTAS, J. L.: Effective Oscillation-Based Test for Application to a DTMF Filter Bank, Proc. IEEE ITC (1999), 549-555.Search in Google Scholar

SANTO ZARNIK, M.—NOVAK, F.—MACEK, S.: Design of Oscillation-Based Test Structures for Active RC Filters, IEEE Proc.-Circuits Devices Syst. 147 No. 5 (2000), 297-302.10.1049/ip-cds:20000601Search in Google Scholar

DIAS, P. M.—FRANCA, J. E.—PAULINO, N.: Oscillation Test Methodology for a Digitally-Programmable Switched-Current Biquad, Proc. IEEE Int'l Mixed Signal Testing Workshop, 1996, pp. 221-226.Search in Google Scholar

ARABI, K.—KAMINSKA, B.: Oscillation Built-in Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits, Proc. International Test Conference, 1997, pp. 786-795.Search in Google Scholar

HUERTAS, G.—VAZQUEZ, D.—RUEDA, A.—HUERTAS, J. L.: Oscillation-Based Test in Bandpass Oversampled A/D Converters, Microelectronics Journal 34 No. 10 (2003), 927-936.10.1016/S0026-2692(03)00163-0Search in Google Scholar

HUERTAS, J. L.: Test and Desgin-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, Dordrecht, 2004.10.1007/978-0-387-23521-9Search in Google Scholar

SANCHEZ, G. H.—DE LA VEGA, D. V. G.—RUEDA, A. R.—DIAZ, J. L. H.: Oscillation-Based Test in Mixed-Signal Circuits, Springer, Dordrecht, 2006.10.1007/1-4020-5315-0Search in Google Scholar

SANTO ZARNIK, M.—NOVAK, F.—MACEK, S.: Efficient Go No-Go Test of Active RC Filters, Int. J. of Circuit Theory and Applications 26 No. 5 (1998), 523-529.10.1002/(SICI)1097-007X(199809/10)26:5<523::AID-CTA27>3.0.CO;2-2Search in Google Scholar

HUERTAS, G.—VAZQUEZ, D.—PERALIAS, E. J.—RUEDA, A.—HUERTAS, J. L.: Testing Mixed-Signal Cores: a Practical Oscillation-Based Test in an Analog Macrocell, IEEE Design & Test of Computers, 19 No. 6 (2002), 73-82.Search in Google Scholar

RAGHUNATHAN, A.—SHIN, H. J.—ABRAHAM, J. A.—CHATTERJEE, A.: Prediction of Analog Performance Parameters Using Oscillation Based Test, 22^nd IEEE VLSI Test Symposium (VTS), 2004, pp. 377-382.Search in Google Scholar

RAGHUNATHAN, A.—CHUN, J. H. P.—ABRAHAM, J. A.—CHATTERJEE, A.: Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters, Proc. Int. Test Conference, 2004, pp. 252-261.Search in Google Scholar

VAZQUEZ, D.—HUERTAS, G.—LEGER, G.—RUEDA, A.—HUERTAS, J. L.: Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation, Proc. 20^th IEEE VLSI Test Symposium (VTS), 2002, pp. 433-438.Search in Google Scholar

MRAK, P.—BIASSIZO, A.—NOVAK, F.: Measurement Accuracy of Oscillation Based Test of Analog-To-Digital Converters, ETRI Journal 32 No. 1 (2010), 154-156.10.4218/etrij.10.0209.0285Search in Google Scholar