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Optimal Deep Learning-Based Recognition Model for EEG Enabled Brain-Computer Interfaces Using Motor-Imagery


Brain-Computer Interfaces (BCIs) facilitate the translation of brain activity into actionable commands and act as a crucial link between the human brain and the external environment. Electroencephalography (EEG)-based BCIs, which focus on motor imagery, have emerged as an important area of study in this domain. They are used in neurorehabilitation, neuroprosthetics, and gaming, among other applications. Optimal Deep Learning-Based Recognition for EEG Signal Motor Imagery (ODLR-EEGSM) is a novel approach presented in this article that aims to improve the recognition of motor imagery from EEG signals. The proposed method includes several crucial stages to improve the precision and effectiveness of EEG-based motor imagery recognition. The pre-processing phase starts with the Variation Mode Decomposition (VMD) technique, which is used to improve EEG signals. The EEG signals are decomposed into different oscillatory modes by VMD, laying the groundwork for subsequent feature extraction. Feature extraction is a crucial component of the ODLR-EEGSM method. In this study, we use Stacked Sparse Auto Encoder (SSAE) models to identify significant patterns in the pre-processed EEG data. Our approach is based on the classification model using Deep Wavelet Neural Network (DWNN) optimized with Chaotic Dragonfly Algorithm (CDFA). CDFA optimizes the weight and bias values of the DWNN, significantly improving the classification accuracy of motor imagery. To evaluate the efficacy of the ODLR-EEGSM method, we use benchmark datasets to perform rigorous performance validation. The results show that our approach outperforms current methods in the classification of EEG motor imagery, confirming its promising performance. This study has the potential to make brain-computer interface applications in various fields more accurate and efficient, and pave the way for brain-controlled interactions with external systems and devices.

Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing