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Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation


We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell’s law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Calendario de la edición:
6 veces al año
Temas de la revista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing