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Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy


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[1] VAN DER ZIEL, A.—TONG, H. : Low Frequency Noise Predicts when a Transistor will Fail, Electronics 39 No. 24 (1966), 95–97.Search in Google Scholar

[2] GUPTA, M. S. : Applications of Electrical Noise, Proceedings of IEEE 63 No. 7 (July 1975), 996–1010.10.1109/PROC.1975.9877Search in Google Scholar

[3] DAI, Y. : Optimal Low-Frequency Noise Criteria used as a Reliability Test for BJTs and Experimental Results, Microelectronics Reliability 31 No. 1 (1991), 75–78.10.1016/0026-2714(91)90350-GSearch in Google Scholar

[4] CLAEYS, C.—SIMOEN, E. : Noise as Diagnostic Tool for Semiconductor Material and Device Characterization, Journal of the Electrochemical Society 145, No. 6 (June 1998), 2058–2067.10.1149/1.1838597Search in Google Scholar

[5] SIKULA, J.—VASINA, P.—MUSILOVA, V. : 1/f Noise in GaAs Schottky Diodes, Physica Status Solidi A-Applied research 84 No. 2 (1984), 693–696.10.1002/pssa.2210840244Search in Google Scholar

[6] JONES, B. K. : Electrical Noise as a Reliability Indicator in Electronic Device and Components, IEE Proceedings – Circuits Device and System 149 No. NSI (Feb 2002), 13–22.10.1049/ip-cds:20020331Search in Google Scholar

[7] VANDAME, L. K. J. : Opportunities and Limitations to Use Low-Frequency Noise as a Diagnostic Tool for Device Quality, Proceedings of the 17th International Conference Noise and Fluctuations ICNF 2003, Prague, pp. 735–748.Search in Google Scholar

[8] KOKTAVY, P.—VANEK, J.—CHOBOLA, Z. : Solar Cells Noise Diagnostic and LBIC Comparison, 19th International Conference on Noise and Fluctuations, AIP conference proceedings, vol. 922, Tokyo, Japan, 2007, pp. 306–309.10.1063/1.2759689Search in Google Scholar

[9] BYCHIKHIN, S.—POGANY, D.—VANDAMME, L. K. J.—MENEGHESSO, G.—ZANONI, E. : Low-Frequency Noise Sources in As-Prepared and Aged GaN-based Light-Emitting Diodes, J. Appl. Phys 97 No. 12, Article Nr. 123714, 2005.Search in Google Scholar

[10] KONCZAKOWSKA, A. : Lifetime Dependence on 1/f Noise of Bipolar Transistors, Proc. of Noise in Physical Systems (C. M. van Vliet, ed.), vol. 489, World Scientific, Singapore, 1987.Search in Google Scholar

[11] CHOBOLA, Z. : Noise as a Tool for Non-Destructive Testing of Single-Crystal Silicon Solar-Cells, In Microelectronics Reliability, vol. 41, 2001, pp. 1947–1952.10.1016/S0026-2714(01)00219-0Search in Google Scholar

[12] CHOBOLA, Z. : Noise as Characterization for GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy, Semiconductor Lasers and Laser Dynamics Iv, 7720, 2010.10.1117/12.854891Search in Google Scholar

[13] CHOBOLA, Z. : Impulse Noise in Silicon Solar Cells, Microelectronics Journal 32/9 (2001), 707–711.10.1016/S0026-2692(01)00059-3Search in Google Scholar

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