Coupled Defect Level Recombination in the P—N Junction

ISE Integrated System Engineering, Release 7.0, Volume 4a (1995), p. 12 215.Search in Google Scholar

SCHENK, A.—KRUMBEIN, U.: Coupled Defect Recombination: Theory and Application to Anomalous Diode Characteristics, J. Appl. Phys. 78 (1995), 3185.10.1063/1.360007Search in Google Scholar

RACKO, J.: Unpublished results.Search in Google Scholar

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