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First-principle study on the effect of S/Se/Te doping and VZn-Hi coexistence on ZnO electrical conductivity


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Introduction

ZnO exhibits high exciton binding energy (60 meV) [1] and electron mobility [2] at room temperature. It finds wide-ranging applications, including in light-emitting diodes, blue light, UV light-emitting devices [3,4,5], etc. However, the high resistivity and poor stability of ZnO limit its application in the design of intrinsic ZnO optoelectronic devices, and obtaining high-quality p-type ZnO semiconductors remains a significant challenge [6].

Studies have shown that the valence band top remarkably shifts after doping S/Se/Te in ZnO, which provides a great possibility to achieve the p-ZnO [7]. Experimentally, Niu et al. [8] investigated the electrical properties of sulfur on the effect of S/N doped ZnO thin films by radio-frequency (RF) magnetron sputtering. The study showed that p-type semiconductor was actualized in S-doped ZnO. Dib et al. [9] investigated the transport properties of the ZnSxO1−x using the sol–gel method. The results showed that S doping leads to a large increase in the charge carrier concentration in the ZnO system. When x = 0.1, the maximum charge concentration of acceptor carriers is NA = 2.139×1022 cm−3 and the mobility μ = 16.2610×10−10 cm2·V−1·s−1. Cai et al. [10] studied the p-type conductivity of Se–N co-doped ZnO films by RF magnetron sputtering. The study indicated that under the same growth and annealing conditions, ZnO:N has n-type conductivity, whereas ZnO:Se-N has p-type conductivity, and the hole concentration reaches 4×10−16 cm−3. Tang et al. [11] investigated the p-type conductivity of N single-doped and Te–N co-doped ZnO by metal-organic chemical vapor deposition (MOCVD). It is found that the hole carrier concentration of the Te–N co-doped ZnO is remarkably higher than that of N-doped ZnO. Park et al. [12] investigated the p-type conductivity of Te–N co-doped ZnO system by molecular beam epitaxy. It is found that N-doped ZnO exhibits n-type, whereas Te–N co-doped ZnO transforms to p-type, and the hole concentration reaches 4×10−16 cm−3.

Theoretically, Persson et al. [13] used the first-principle approaches to study the effect of p-type ZnO in the ZnO1−xSx system. The results showed that S doping leads to a remarkable upward shift in the valence band top of ZnO and a decrease in bulk ionization energy, which improves the doping efficiency and stability of p-type ZnO. Hou et al. [14] used the first-principle approaches to investigate the effect of triaxial strain on the p-type conductivity of a ZnO (S, Se, Te) system. The research showed that the Zn36RO35 (R = S/Se/Te) systems exhibit p-type conductivity, and the hole mobility increases when −5% compressive strain is applied. There are relatively few theoretical calculations from the literature dealing with the effect of S/Se/Te doped ZnO on electrical conductivity.

Some progress has been made in the study of S/Se/Te doping on the p-type conductivity of ZnO, which can solve the bottleneck problem that severely limits the p-type conductivity of ZnO [6,7,8,9,10,11,12,13,14]. While there are studies in the literature (such as those of Liu et al. [15] and Zeng et al. [16]) delving into the benefits that a Zn vacancy (VZn) can bring in terms of enabling ZnO to achieve p-type conductivity, these, for the most part, lack theoretical calculations.. Second, previous experimental studies [7,8,9,10,11,12,13,14] have ignored the fact that in the process of semiconductor preparation, when the chemical vapor deposition method and the molecular beam epitaxial growth method are used in the vacuum environment, the H-gap impurities will inevitably remain in the ZnO matrix [17]. The study of VZn under experimental conditions poses a challenge. Therefore, it is necessary to systematically study the effects of equivalent element S/Se/Te doping and VZn–H gap (Hi) on the electrical conductivity of ZnO. Hence, this research has practical importance and academic value.

Model construction and calculation model
Model construction

This paper is based on the hexagonal wurtzite structure of ZnO with symmetry C6V4 C_{6V}^4 . The construction of pure Zn36O36 supercell is shown in Figure 1A. This paper considered the unipolarity of ZnO in the z-axis direction and is thus asymmetric. Therefore, the selected doping atomic positions are different, and the stability of the ZnO system is also different. Therefore, a Zn35RO35 (R = S/Se/Te) model was constructed, in which the R (R = S/Se/Te) atoms that replaced O atoms and Zn vacancies coexisted, three different substitution positions of R (R = S/Se/Te) atoms were selected from near to far with the relative VZn as the center and were denoted by a1, a2, and a3, respectively, and the fixed VZn positions were (0.444, 0.556, 0.500) as shown in Figure 1B. The influence of Hi at different positions on the stability of the ZnO system was studied with consideration of practical factors. From the relative VZn center from near to far, three doping positions of Hi were considered using b1 (0.700, 0.500, 0.400), b2 (0.763, 0.532, 0.289), and b3 (0.879, 0.591, 0.162), respectively. Then the model of Zn35RHiO35 (R = S/Se/Te) was constructed, as shown in Figure 1C. The doping amounts of S/Se/Te in the model constructed in this paper (1.39 mol%) are lower than the doping amount without phase transition used in the experiments carried out in several comparable studies in the literature [18,19,20]. The VZn content in this paper is 2.78 mol%, which is much lower than the VZn content of 9 mol% used in the experiments comprised in the studies of Wu et al. [21] and Ghosh et al. [22], and does not cause a phase change in the system. Therefore, the doping amount used in this study is feasible.

Fig. 1

Model: (A) Zn36O36, (B) Zn35RO35 (R = S/Se/Te), and (C) Zn35RHiO35 (R = S/Se/Te).

Gray, red, yellow, and green represent Zn, O, R (R = S/Se/Te), and H atoms, respectively

Calculation model

This paper uses the CASTEP (8.0) module in MS for calculations. Based on density functional theory (DFT) [23], generalized gradient approximation (GGA) was adopted [24], and the plane wave supersoft pseudopotential method based on Perdew–Burke–Ernzerhof (PBE) functional was selected [25]. The plane wave cutoff energy was set to 340 eV. The effect of different cutoff energies on the energy convergence of undoped Zn36O36 was tested. Figure 2 indicates that when the cutoff energy reaches 340 eV, the energy of the system converges and tends to be stable, and so the choice of a cutoff energy of 340 eV used in this paper may be said to be reasonable. This is consistent with previous calculations of the energy cutoff radius [26, 27]. The k point sampling of the first Brillouin zone was 4×4×2. The maximum interatomic force, maximum internal stress, and tolerance shift convergence accuracy were 0.01 eV·Å−1, 0.02 GPa, and 0.0005 Å, respectively. The electron density is not spin polarized, and the charge was set to values adapted to a given case. The valence electron configuration of each atom is: S–3s23p4, Se–4s24p4, Te–5s25p4, Zn–3d104s2, O–2s22p4, and H–1s1.

Fig. 2

Relationship between total energy of Zn36O36 and cutoff energy

Results and discussion
Crystal structure, formation energy, and stability analyses

The doped Zn36O36, Zn35RO35 (R = S/Se/Te), and Zn35RHiO35 (R = S/Se/Te) systems were geometrically optimized, and the optimized results are listed in Table 1. The calculated lattice constants of the Zn36O36 system are in good agreement with the experimental values of a = b = 3.258 Å and c = 5.220 Å [28]. The rationality underlying the choice of parameters employed in this study is verified.

Relative distance d between the replacement atoms and VZn; the reduced lattice constants a and c and volume V of Zn36O36, Zn35RO35 (R = S/Se/Te)a1−a3, and Zn35RHib1b3O35a2 {\rm{Zn}_{35}}{\rm{R}}{{\rm{H}}_{\rm{i}}}^{b1 - b3}{\rm{O}}_{35}^{a2} (R = S/Se/Te) doping systems

Models dM − VZn (Å) a (Å) c (Å) V (Å3)
Zn36O36 a = 3.287 c = 5.299 49.485
Zn35SO35a1 {\rm{Zn}_{35}}{\rm{SO}}_{35}^{a1} 1.992 a = 3.301 c = 5.298 49.988
Zn35SO35a2 {\rm{Zn}_{35}}{\rm{SO}}_{35}^{a2} 3.811 a = 3.303 c = 4.955 50.490
Zn35SO35a3 {\rm{Zn}_{35}}{\rm{SO}}_{35}^{a3} 4.570 a = 3.303 c = 5.334 50.385
Zn35SeO35a1 {\rm{Zn}_{35}}{\rm{SeO}}_{35}^{a1} 1.992 a = 3.304 c = 5.294 50.047
Zn35SeO35a2 {\rm{Zn}_{35}}{\rm{SeO}}_{35}^{a2} 3.811 a = 3.307 c = 5.351 50.708
Zn35SeO35a3 {\rm{Zn}_{35}}{\rm{SeO}}_{35}^{a3} 4.570 a = 3.307 c = 5.338 50.584
Zn35TeO35a1 {\rm{Zn}_{35}}{\rm{TeO}}_{35}^{a1} 1.992 a = 3.308 c = 5.295 50.204
Zn35TeO35a2 {\rm{Zn}_{35}}{\rm{TeO}}_{35}^{a2} 3.811 a = 3.316 c = 5.373 51.131
Zn35TeO35a3 {\rm{Zn}_{35}}{\rm{TeO}}_{35}^{a3} 4.570 a = 3.315 c = 5.344 50.927
Zn35SHib1O35a1 {\rm{Zn}_{35}}{\rm{SH}_{\rm{i}}}^{b1}{\rm{O}}_{35}^{a1} 1.992 a = 3.307 c = 5.316 50.332
Zn35SHib2O35a1 {\rm{Zn}_{35}}{\rm{SH}_{\rm{i}}}^{b2}{\rm{O}}_{35}^{a1} 1.992 a = 3.332 c = 5.289 50.427
Zn35SHib3O35a1 {\rm{Zn}_{35}}{\rm{SH}_{\rm{i}}}^{b3}{\rm{O}}_{35}^{a1} 1.992 a = 3.314 c = 4.968 50.546
Zn35SeHib1O35a1 {\rm{Zn}_{35}}{\rm{SeH}_{\rm{i}}}^{b1}{\rm{O}}_{35}^{a1} 1.992 a = 3.309 c = 5.316 50.402
Zn35SeHib2O35a1 {\rm{Zn}_{35}}{\rm{SeH}_{\rm{i}}}^{b2}{\rm{O}}_{35}^{a1} 1.992 a = 3.334 c = 5.286 50.468
Zn35SeHib3O35a1 {\rm{Zn}_{35}}{\rm{SeH}_{\rm{i}}}^{b3}{\rm{O}}_{35}^{a1} 1.992 a = 3.316 c = 5.317 50.607
Zn35TeHib1O35a1 {\rm{Zn}_{35}}{\rm{TeH}_{\rm{i}}}^{b1}{\rm{O}}_{35}^{a1} 1.992 a = 3.317 c = 5.322 50.620
Zn35TeHib2O35a1 {\rm{Zn}_{35}}{\rm{TeH}_{\rm{i}}}^{b2}{\rm{O}}_{35}^{a1} 1.992 a = 3.345 c = 5.293 50.690
Zn35TeHib3O35a1 {\rm{Zn}_{35}}{\rm{TeH}_{\rm{i}}}^{b3}{\rm{O}}_{35}^{a1} 1.992 a = 3.325 c = 5.322 50.825

Table 1 showed that the a, c, and V of Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) were larger than those of Zn36O36. One reason for this finding is attributable to the radius effect: the S/Se/Te ionic radius (2.14/2.24/2.42 Å) [29] is larger than the O ionic radius (1.71 Å) [29]. The second reason is the interionic force: the repulsive force between VZn and O, R (R = S/Se/Te) is greater than the attractive force between VZn and Zn in the Zn35RO35 (R = S/Se/Te) systems; the repulsive forces between H and VZn, between VZn and O, and between VZn and R (R = S/Se/Te) are greater than the attraction force between O and H, VZn and H, and H and R (R = S/Se/Te) in the Zn35RHiO35 (R = S/Se/Te) systems. Therefore, the volume of the Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) systems increases. Table 1 shows that compared with the Zn35RO35a2a3 {\rm{Zn}_{35}}{\rm{RO}}_{35}^{a2 - a3} (R = S/Se/Te) and Zn35RHiO35a2a3 {\rm{Zn}_{35}}{\rm{RH}_{\rm{i}}}{\rm{O}}_{35}^{a2 - a3} (R = S/Se/Te) systems, when the relative distance between the R (R = S/Se/Te) substitution atom and VZn is closest to 1.992 Å, the increase in the equivalent unit cell volume caused by doping can be reduced, improving the stability of the structure. This outcome was further confirmed by the formation energies.

The formation energies of all the doped systems were calculated to analyze the stability of doped systems. The calculation formula is expressed as the following in the literature [30, 31]: Ef(R+VZn)=EZnO:R+VZnEZnOμR+μO+μZn \matrix{ {{E_f}\left( {R + {V_{Zn}}} \right) = {E_{ZnO:R + {V_{Zn}}}}} \hfill \cr {\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\; - \;{E_{ZnO}} - {\mu _R} + {\mu _O} + {\mu _{Zn}}} \hfill \cr } Ef(R+VZn+Hi)=EZnO:R+VZn+HiEZnOμRμHi+μO+μZn \matrix{ {{E_f}\left( {R + {V_{Zn}} + {H_i}} \right) = {E_{ZnO:R + {V_{Zn}} + {H_i}}}} \hfill \cr {\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\;\,\,\;\;\; - \;{E_{ZnO}} - {\mu _R} - {\mu _{{H_i}}} + {\mu _O} + {\mu _{Zn}}} \hfill \cr } where EZnOR+VZn represents the total energy of the ZnO:VZn+R (R = S/Se/Te) system; EZnOR+VZn+Hi is the total energy of the ZnO:VZn+Hi+R (R = S/Se/Te) system; EZnO represents the total energy of the pure Zn36O36 system; and μR, μHi, μO, and μZn are the chemical potentials of S/Se/Te atom, H atom, O atom, and Zn atom, respectively. μZnO(bulk) = μO + μZn; thus, μO and μZn were included in the calculation formula of the Ef of the doped system. The Ef of the system were the same in O- and Zn-rich conditions; hence, this paper did not separately calculate the Ef in O- and Zn-rich conditions. The Ef calculation results are shown in Figure 3. According to Figure 3, among the Zn35RO35 (R = S/Se/Te) systems, the Zn35SO35 system had the lowest formation energy and was relatively stable. This result is attributable to the fact that among the three dopant atoms of S, Se, and Te, the radii of S and O atoms were the closest, the lattice distortion caused by the substitution of S atom for O atom was the smallest, and the structure was the most stable. In Zn35RO35a1a3 {\rm{Zn}_{35}}{\rm{RO}}_{35}^{a1 - a3} (R = S/Se/Te), when the R replacement atom was closest to VZn (1.992 Å), the Ef of the Zn35RO35a1 {\rm{Zn}_{35}}{\rm{RO}}_{35}^{a1} (R = S/Se/Te) was the most stable system.

Fig. 3

Formation energies of Zn35RO35a1a3 {\rm{Zn}_{35}}{\rm{RO}}_{35}^{a1 - a3} (R = S/Se/Te) systems with different relative distances between R substitution atoms and VZn

The system with the lowest formation energy in the Zn35RHiO35 (R = S/Se/Te) system was selected, and the formation energies of the b1, b2, and b3 positions of the Hi were calculated to explore the effect of the Hi position on the stability of the ZnO. The results are shown in Figure 4. The figure shows that the Ef of the Zn35RHiO35 (R = S/Se/Te) system also increased gradually with the increase in the distance between Hi and VZn. The formation energy of the Zn35RHib1O35a1 {\rm{Zn}_{35}}{\rm{RH}_{\rm{i}}}^{b1}{\rm{O}}_{35}^{a1} (R = S/Se/Te) system was the lowest when Hi was located at the b1 position, which is the nearest neighbor center position, because VZn was the acceptor, and a Coulomb attraction was present between it and the donor Hi. A closer distance corresponds to a more stable system. This result is consistent with a similar research [32].

Fig. 4

Formation energies of the Zn35RHib1b3O35a1 {\rm{Zn}_{35}}{\rm{RH}_{\rm{i}}}^{b1 - b3}{\rm{O}}_{35}^{a1} (R = S/Se/Te) system with different positions of b1, b2, and b3 in the Hi

Considering the structural stability of the system, the most stable Zn35RO35a1 {\rm{Zn}_{35}}{\rm{RO}}_{35}^{a1} (R = S/Se/Te) and Zn35Rb1HiO35a1 {\rm{Zn}_{35}}{{\rm{R}}^{b1}{\rm H}_{\rm{i}}}{\rm{O}}_{35}^{a1} (R = S/Se/Te) systems were selected as the research objects. The superscripts of the above systems were omitted to facilitate subsequent research.

Mobility analysis

Mobility is an important parameter used to measure the conductivity of a system. The p-type conductivity of the system is proportional to the hole mobility. A higher hole mobility indicates that the p-type conductivity of a system is better. The hole mobility formula [33, 34] is: μh3D=23/2π1/23c3Dh¯4eEI2mh*5/2(kBT) \mu _h^{3D} = {{{2^{3/2}}{\pi ^{1/2}}} \over 3}{{{c^{3D}}{{\overline h }^4}e} \over {E_I^2m_h^{*5/2}\left( {{k_B}T} \right)}} where c3D is the elastic modulus, defined as c3D=[2Eδ2]V0 {c^{3D}} = {{\left[ {{{{\partial ^2}E} \over {\partial {\delta ^2}}}} \right]} \over {{V_0}}} [35], E is the total energy of the system, and V0 is the total volume of the system at equilibrium. EI is the deformation potential energy, defined as EI=ΔEδ {E_I} = {{\Delta E} \over \delta } [34], where δ is the deformation amount, and ΔE is the energy change at the top of the valence band along the transport direction. mh* m_h^* is the effective mass of the hole, defined as m*=h¯2(d2Edk2)1 {m^*} = {\bar h^2}{\left( {{{{d^2}E} \over {d{k^2}}}} \right)^{ - 1}} , where m* is the effective mass of the carrier, h¯ \bar h is Planck's constant, k is the direction of the wave vector, and E is the energy of the carrier in the wave vector k. T is the temperature, which was set to 300 K. The smaller the mh* m_h^* of the holes and the smaller the EI, the greater the system mobility and the better the electrical conductivity. The calculated data of each system according to Eq. (3) are shown in Table 2. The calculated effective mass of pure Zn36O36 was consistent with the experimental value ascertained in the study of Janotti et al. [36], which shows that the data in this paper are reliable.

Effective mass, elastic modulus, deformation potential, and hole mobility of Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) systems

Models Direction mh*·mo−1 c3D (×1011J·m−2) EI(eV) μh (cm2·V−1·s−1)
Zn36O36 ‖ a 0.22 0 0 0
0.21 [35] 0 0 0
‖ c 0.17 0 0 0
0.24 [35] 0 0 0
Zn35SO35 ‖ a 6.91 54.17 5.07 103.60
‖ c 137.89 43.12 4.54 0.058
Zn35SeO35 ‖ a 35.93 68.79 2.80 6.698
‖ c 744.99 67.35 2.77 0.004
Zn35TeO35 ‖ a 7.23 123.73 44.74 2.707
‖ c 5.06 136.331 46.96 6.625
Zn35SHiO35 ‖ a 19.70 82.69 2.96 33.795
‖ c 10.31 57.79 2.47 170.383
Zn35SeHiO35 ‖ a 12.02 95.64 20.54 2.79
‖ c 2.25 71.01 17.70 183.061
Zn35TeHiO35 ‖ a 9.69 118.47 38.63 1.674
‖ c 1.74 104.50 36.28 122.634

Table 2 shows that the hole mobilities of the Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) systems are anisotropic. This result is attributable to the fact that ZnO has unipolarity, and therefore, the mobility of the system is different along different transport directions. In the Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) systems, the hole mobilitiy of the Zn35SO35 system along the a-axis was the highest, and the hole mobilities of the Zn35SeHiO35 system along the c-axis were the highest. Table 2 displays that in tandem with the unintentional incorporation of Hi, the hole mobility of the doped system decreases along the a direction and increases along the c direction. The results showed that the unintentional incorporation of the Hi can greatly increase the mobility of the doping system along the c direction, but it is not conducive to the mobility along the a direction.

Band analysis

The calculated band structure of pure Zn36O36 system is shown in Figure 5. The bandgap of the pure Zn36O36 system is 0.73 eV, which is close to the calculated result available from the literature [37], but inconsistent with the experimental value (3.37 eV). This is because the energy of Zn–3d is overestimated when the architecture is calculated using GGA, resulting in an underestimation of the bandgap [38]. However, this error has little effect on the analysis of the relative physical quantities of the ZnO system.

Fig. 5

Band structure of pure Zn36O36

The calculated band structures of the Zn35RO35 (R = S/Se/Te) and Zn35RHiO35 (R = S/Se/Te) systems are shown in Figures 6A–6F.

Fig. 6

Band structure distribution: (A) Zn35SO35; (B) Zn35SeO35; (C) Zn35TeO35; (D) Zn35SHiO35; (E) Zn35SeHiO35; and (F) Zn35TeHiO35

According to Figures 6A–6F, the valence band maximum (VBM) and conduction band minimum (CBM) of the doped systems correspond to the same high symmetry point, which indicates that they are all direct bandgap semiconductors. The figures indicate that R (R = S/Se/Te) and Hi lead to remarkable changes in the valence and conduction bands of the system. Among them, the VBM and CBM of the Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems moved up, the Fermi level entered the valence band, and the systems were the p-type semiconductor. However, the VBM and CBM of the Zn35TeO35, Zn35SeHiO35, and Zn35TeHiO35 systems moved down, and the Fermi level was located between the valence and conduction bands, indicating that no p-type degeneracy had occurred. Therefore, studying the electrical conductivities of the Zn35TeO35, Zn35SeHiO35, and Zn35TeHiO35 systems will be meaningless; accordingly, these three systems were not further studied.

Hole transport characteristics analysis

The total density of states (DOS) and partial density of states (PDOS) of the Zn36O36, Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems were calculated to study the effect of doping defects on the hole concentration of the ZnO system (Figures 7A–7D).

Fig. 7

DOS analysis diagram: (A) Zn36O36, (B) Zn35SO35, (C) Zn35SeO35, and (D) Zn35SHiO35. DOS, density of states

Figures 7A–7D illustrate that the O–2p state in the Zn36O36 system determines the VBM, and the Zn–4s state determines the CBM. Its Fermi level did not enter the valence band and was not a p-type degeneracy semiconductor. The Fermi levels of the Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems entered the valence band, which indicates that they are all p-type semiconductors. This is consistent with the analysis results in Section 3.3.

Figures 7B and 7C indicate that the upper valence bands of the Zn35SO35 and Zn35SeO35 systems in the range of −3 eV to 0 eV were formed by the hybridization of O–2p and a small amount of Zn–3d state orbital. The lower valence band from −6 eV to −3 eV was formed by the hybridization of Zn–3d and a small amount of O–2p orbitals. The electrons in the O–2p and S–3p/Se–4p states occupy the vicinity of the Fermi level, and pp state coupling occurs and the VBM moves up. This is because the atomic number of O group elements increases, which leads to the rise of the p-state energy level and the rise of the VBM. The carriers were degenerated, and the system exhibited p-type conductivity. The calculation results showed that S/Se doping is beneficial to the transition of the ZnO system from a natural n-type semiconductor to a p-type semiconductor.

Figure 7D shows that the valence band of the Zn35SHiO35 system was formed by the coupling of O–2p, Zn–3d, and S–2p state orbits. Near the Fermi level, pp state coupling occurs between the p-state orbital of S and the p-state orbital of O, the VBM moves up, and the Fermi level enters the valence band. The reason is the same as above. Notably, Figure 7D shows that the H–1s state contributes to the DOS near −7 eV. This result indicates that the doping of Hi affects the low-valence band region and does not contribute much to the electronic states near the Fermi level.

Another reference factor that cannot be ignored when exploring the conductivity of p-type semiconductors is the hole concentration. In this paper, as shown in Figures 7B–7D, Origin 8.5 software was used to integrate the part of the DOS beyond the Fermi level, and the hole concentration Pi is equal to the integral value divided by the total volume of the doped system. The calculation results are shown in Table 3.

Hole concentrations of the Zn36O36, Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems

Models Pi (×1021 cm−3)
Zn36O36 0
Zn35SO35 2.80
Zn35SeO35 2.42
Zn35SHiO35 1.74

Table 3 shows that the hole concentrations of the Zn35SO35 and Zn35SeO35 systems were considerably higher than that of the Zn35SHiO35 system. The result was due to VZn as the acceptor, and the donor Hi needs to suppress and compensate for VZn. Therefore, the hole concentration of the Zn35SHiO35 system decreased. Among the doped systems, the Zn35SO35 system had the highest hole concentration of 2.80×1021 cm−3 and the best conductivity.

Conductivity analysis

The conductivity calculation formula of a p-type semiconductor is expressed in the literature [39] as the following: σi=piμhe {\sigma _i} = {p_i}{\mu _h}e where μh and e represent the hole mobility and the amount of elementary charge, respectively. The calculated hole conductivities of all the doped systems along different transport directions are shown in Table 4.

Conductivities of the Zn36O36, Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems

Models σi (×102 S·cm−1)

G→ F G→ Z
Zn36O36 0 0
Zn35SO35 464.39 0.26
Zn35SeO35 27.08 0.014
Zn35SHiO35 94.04 474.11

Table 4 shows that the conductivity of the pure Zn36O36 system is 0. Compared with the conductivity of the Zn36O36 system, the conductivities of the Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems were remarkably higher. The calculation results showed that the Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems were all beneficial in terms of improving the conductivity of the ZnO. The comparison of the Zn35SO35 and Zn35SeO35 systems showed that the conductivity of the S-doped system is remarkably larger than that of the Se-doped system, indicating that S doping is more beneficial in terms of improving the p-type conductivity of ZnO. The comparison of the Zn35SO35 and Zn35SHiO35 systems revealed that Hi doping reduces the conductivity of the doped system along the G→ F direction and increases the conductivity of the doped system along the G→ Z direction, indicating that Hi doping can effectively improve the transport performance of the system along the G→ Z direction. Interestingly, in all the doped systems, the conductivities of the Zn35SO35 and Zn35SHiO35 systems were the largest along the G→ F and G→ Z directions, respectively.

Conclusion

In this paper, the first-principle effects of S/Se/Te doping and the coexistence of VZn and Hi in ZnO were investigated. The study found that Te doping cannot achieve the p-type degeneracy of the ZnO system, which has no research significance, and S/Se doping is beneficial to the p-type degeneracy of the ZnO system, remarkably improving the hole mobility and electrical conductivity. The Zn35SO35, Zn35SeO35, and Zn35SHiO35 systems all have good p-type conductivity. Among them, the Zn35SO35 system has the highest hole concentration along the G→ F direction at 2.80×1021 cm−3, and the best conductivity. The conductivity of the Zn35SHiO35 system was the largest along the G→ Z direction. This result plays a guiding role in obtaining higher-quality p-type ZnO.

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