The Journal of Institute of Measurement Science of Slovak Academy of Sciences

Measurement Science Review

<abstract xml:lang="en"><title style='display:none'>Counting Method for Measuring and Linearity Checking Photometry Devices</title>The possibility of calibration and linearity check of optical detectors in a wide dynamic range by method of counting separate parts of energy is investigated. Counting method permits nonselective energy change of measuring optical pulse more then 105 times. A construction of working source of radiation with GaAs LED is described. Results of experimental investigation are presented.</abstract>

Counting Method for Measuring and Linearity Checking Photometry Devices

Vavilov State Optical Institute the Russian Federation State Scientific and Manufacturing Corporation, 12, Birgevaya str., Saint Petersburg, 199034, Russia

Keywords

<article-title>Counting Method for Measuring and Linearity Checking Photometry Devices</article-title>

{"article-title":"Counting Method for Measuring and Linearity Checking Photometry Devices"}

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Editor-in-Chief: Ivan Frollo, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Executive Editors: Viktor Witkovský, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Ida Prokopčáková, Institute of Experimental Psychology, Slovak Academy of Sciences, Slovakia Editor: Vladimír Juráš, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Editorial Board: Olli Aumala, Tampere University of Technology, Finland Denny Borsboom, Department of Psychology, University of Amsterdam, The Netherlands Isabel Van Driessche, Ghent University-Laboratory of Organometallics and Catalysis, Belgium Zoltán Domotor, Department of Philosophy, University of Pennsylvania, Philadelphia, U.S.A. Miroslav Dovica, Technical University of Košice, Slovakia Stanislav Duriš, Technical University Bratislava, Slovakia Osman Gencel, Faculty of Engineering, Bartin University, Bartin, Turkey Adam Glowacz, AGH University of Science and Technology, Poland Marco L. H. Gruwel, Department of Chemistry, University of Manitoba, Winnipeg, Canada Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering, Russia Dietrich Hofmann, SpectroNet - International Collaboration Cluster, Jena, Germany Dariusz J. Jakóbczak, Technical University of Koszalin, Poland György Kozmann, CRIP Research Institute for Technical Physics and Material Science, Hungary Vitalij Novickij, Vilnius Gediminas Technical University, Lithuania Ignacio Lira, Pontificia Universidad Catolica de Chile, Chile Kalju Meigas, Tallinn University of Technology, Estonia Rosario Morello, University Mediterranea of Reggio Calabria, Italy Ganesh R. Naik, Faculty of Engng &amp; Inf. Technology Univ. of Technology, Sydney, Australia Irina G. Palchikova, Technological Design Institute of Scientific Instrument Engineering, Russia Rudolf Palenčár, Technical University Bratislava, Slovakia Nicola Pasquino, University of Naples Federico II, Napoli, Italy Sudheer Rani, Vanderbilt University Institute of Imaging Sciences, Nashville, U.S.A. Paul Regtien, Faculty of Electrical Engineering at the University of Twente, The Netherlands Mario Savino, Politecnico di BARI, Italy Viktor Smieško, Technical University Bratislava, Slovakia Harald Schumny, Physikalisch- Technische Bundesanstalt, Germany Manuch Soleimani, University of Bath, Claverton Down, Bath, UK Michael G. Sowa, Institute for Biodiagnostics, National Research Council of Canada, Canada Peter H. Sydenham, University of South Australia and GSEC Pty Ltd, Australia Zenon Starčuk, Institute of Scientific Instruments, Academy of Sciences, Czech Republic Mihai Tarata, Dept. of Med. Informatics, Uni. of Medicine and Pharmacy of Craiova, Romania Shigeru Takayama, Ritsumeikan University BKC, Faculty of Science and Engineering, Japan Milan Tyšler, Institute of Measurement Science , Slovak Academy of Sciences , Slovakia Julia Volaufova, Louisiana State University Health Sciences Center, New Orleans, U.S.A. Werner Wolf, Universität der Bundeswehr, München, Germany Jan Zakrzewski, Silesian Univ. of Technology, Dep. of Measurement and El. Control, Poland T. Yuvaraja, Channabasaveshwara Institute of Technology, Tumkur City, India Orest Kochan, Lviv Polytechnic National University, Lviv, Ukraine Tao Wang, Shanghai Jiao Tong University, Shanghai, China Language Editor: Ida Prokopčáková, Institute of Experimental Psychology, Slovak Academy of Sciences, Slovakia Technical Editors: Eva Nagyová, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Katarína Kozáková, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Contact: Institute of Measurement Science Slovak Academy of Sciences Dubravska 9. 841 04 BRATISLAVA Slovak Republic Tel: +4212 5910 4511 - secretary of the director, <A href="mailto:umersekr@savba.sk">umersekr@savba.sk</A> Fax: +4212 5910 4594 <A href="http://www.um.sav.sk/en/">www.um.sav.sk/en/</A> Publisher: De Gruyter Poland Bogumiła Zuga 32A Str. 01-811 Warsaw, Poland

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Measurement Science Review

Counting Method for Measuring and Linearity Checking Photometry Devices

E. Kuvaldin
E. Kuvaldin

Publicado en línea: 14 May 2010

Volumen & Edición: Volumen 10 (2010) - Edición 2 (January 2010)

Páginas: 60 - 62

Detalles de publicación y publicación

Measurement Science Review

Vista previa del PDF

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Artículos Recientes

Measurement Science Review

Counting Method for Measuring and Linearity Checking Photometry Devices

E. KuvaldinE. Kuvaldin

Publicado en línea: 14 May 2010

Volumen & Edición: Volumen 10 (2010) - Edición 2 (January 2010)

Páginas: 60 - 62

Detalles de publicación y publicación

Measurement Science Review

Vista previa del PDF

Referencias

Artículos Recientes

E. Kuvaldin
E. Kuvaldin