1. bookVolumen 74 (2023): Heft 1 (February 2023)
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Zeitschrift
eISSN
1339-309X
Erstveröffentlichung
07 Jun 2011
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6 Hefte pro Jahr
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An EMI susceptibility study of different integrated operational transconductance amplifiers

Online veröffentlicht: 07 Mar 2023
Volumen & Heft: Volumen 74 (2023) - Heft 1 (February 2023)
Seitenbereich: 13 - 22
Eingereicht: 31 Oct 2022
Zeitschriftendaten
License
Format
Zeitschrift
eISSN
1339-309X
Erstveröffentlichung
07 Jun 2011
Erscheinungsweise
6 Hefte pro Jahr
Sprachen
Englisch

[1] J. R. Agazzini, R. H. Randall, and F. Rusell, ”Analysis of Problems in Dynamics by Electronic Circuits”, Proceedings of the IRE, vol. 35, no. 5, pp. 444-452, doi: 10.1109/JR-PROC.1947.232616. Search in Google Scholar

[2] L. Fu, Y. Zhaowen, F. Changshun and S. Donglin, ”Extraction and analysis on Conducted Electromagnetic Susceptibility Elements of Integrated Circuits”, IEEE Access, p. 149125-149136 doi: 10.1109/ACCESS.2021.3125051.10.1109/ACCESS.2021.3125051 Search in Google Scholar

[3] A Richelli, L. Colalongo, M. Quarantelli and Z. M. Kovacs-Vajna, ”Robust Design of Low EMI Susceptibility CMOS OpAmp”, IEEE Transactions on Electromagnetic Compatibility, vol. 46, no. 2, pp. 291-298 doi: 10.1109/TEMC.2004.826874.10.1109/TEMC.2004.826874 Search in Google Scholar

[4] O. Aiello and J. M. Redouté, ”Design of a Neural Recording Amplifier Robust to EMI”, Proceedings 2013 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), Australia, May, pp. 1-4 doi: 10.1109/APEMC.2013.7360665.10.1109/APEMC.2013.7360665 Search in Google Scholar

[5] M. Magerl, Ch. Stockreiter and A. Baric, ”Influence of RF Disturbance Phase on Amplifier DPI Characteristics”, 2017 International Symposium on Electromagnetic Compatibility – EMC EROPE, France, November, pp. 1-5 doi: 10.1109/EMCEurope.2017.8094756.10.1109/EMCEurope.2017.8094756 Search in Google Scholar

[6] T. Hino and H. Watanabe, ”Analysis of RF Noise in LDO and Establishment of Noise Immunity”, 2019 International Symposium on Electromagnetic Compatibilty – EMC EUROPE, Spain, September, pp. 508-512 doi: 10.1109/EMCEurope.2019.8872083.10.1109/EMCEurope.2019.8872083 Search in Google Scholar

[7] A. D. Grasso, S. Pennisi, G. Scotti, and A. Trifiletti, ”0.9-V Class-AB Miller OTA in 0.35-m CMOS With Threshold-Lowered Non-Tailed Differential Pair”, IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 64, no. 7, pp. 1740-1747 doi: 10.1109/TCSI.2017.2681964.10.1109/TCSI.2017.2681964 Search in Google Scholar

[8] B. N. Aiyappa, M. Madhusudan, B. Yashaswini, R. Yatish, and M. Nithin, ”Amplifier Design in Weak Inversion and Strong Inversion – A Case Study”, 2017 International Conference on Communication and Signal Processing (ICCSP), India, pp. 1227-1231 doi: 10.1109/ICCSP.2017.8286575.10.1109/ICCSP.2017.8286575 Search in Google Scholar

[9] F. F. Offner, ”Balanced Amplifiers”, Proceedings of the IRE, vol. 35, no. 3, pp. 306-310 doi: 10.1109/JRPROC.1947.232277.10.1109/JRPROC.1947.232277 Search in Google Scholar

[10] J. M. Miller, ”Dependence of the input impedance of a three-electrode vacuum tube upon the load in the plate circuit”, Scientific Papers of the Bureau of Standards, vol. 15, pp. 367-385, retrieved from http://nvlpubs.nist.gov.10.6028/nbsscipaper.024 Search in Google Scholar

[11] D. Krolak and P. Horsky, ”An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores”, Radioengineering, vol. 31, no. 3, pp. 413-421 doi: 10.13164/re.2022.0413.10.13164/re.2022.0413 Search in Google Scholar

[12] P. E. Allen, ”Lecture 240 - Simulation and Measurements of OP AMP”, (Reading: AH - 310-323) [Online], http://pallen.ece.gatech.edu/Academic/ECE6412/Spring2003/L240-Sim&MeasofOpAmps(2UP).pdf. Search in Google Scholar

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