1. bookVolume 31 (2013): Issue 1 (January 2013)
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
access type Open Access

Photo-induced changes in arsenic selenide films

Published Online: 09 Feb 2013
Volume & Issue: Volume 31 (2013) - Issue 1 (January 2013)
Page range: 139 - 145
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

The spectral dependence of the transmittance and reflectance of thermally-evaporated amorphous AsxSe100−x (where x = 20 and 40 at.%) films was measured in the wavelength range of 190–900 nm. A procedure was given for accurate determination of the film thickness using a standard method of numerical differences from the experimental data. The process of indirect electronic transitions was found to be responsible for the photon absorption. The variation of the energy band gap with the exposure time was investigated. Amorphous-crystalline transformations occurring as a result of photoexposure have been confirmed by the structural studies of the As20Se80 specimens using the scanning electron microscope and transmission electron microscope. Photodarkening relaxation under light exposure of the well annealed films was studied and the relaxation process has been described by the stretched exponential function (SEF).

Keywords

[1] Al-ghamdi A. A., Vacuum 80 (2006), 400. http://dx.doi.org/10.1016/j.vacuum.2005.07.00310.1016/j.vacuum.2005.07.003Search in Google Scholar

[2] Shimakawa K., J. Non-Cryst. Solids 77–78 (1985), 1253. http://dx.doi.org/10.1016/0022-3093(85)90885-310.1016/0022-3093(85)90885-3Search in Google Scholar

[3] Saitar M., Hamou J., Ledru A., Saffarini G., Physica B (1998), 248. Search in Google Scholar

[4] Nemanich R. J., Connell G. A. N., Hayes T. M. and Street R. A., Phys. Rev. B 18 (1978), 6900. http://dx.doi.org/10.1103/PhysRevB.18.690010.1103/PhysRevB.18.6900Search in Google Scholar

[5] Afifi M.A., Labib H. H., Morsy A.Y., Metwally H. S., Hegab N. A., Vacuum 43 (1992), 799. http://dx.doi.org/10.1016/0042-207X(92)90139-N10.1016/0042-207X(92)90139-NSearch in Google Scholar

[6] Kolobov A.V., Photo-Induced Metastability in Amorphous Semiconductors, Wiley-WCH, Weinheim (2003) 23. http://dx.doi.org/10.1002/978352760254410.1002/9783527602544Search in Google Scholar

[7] Ganjoo A., Yoshidn N., Shimakawa K., Recent Res. Dev. Appl. Phys. 2 (1999), 129. Search in Google Scholar

[8] Iovu M. S., Shutov S. D., Popescu M., J. Non-Cryst. Solids 299–302 (2002), 924. http://dx.doi.org/10.1016/S0022-3093(01)00992-910.1016/S0022-3093(01)00992-9Search in Google Scholar

[9] Othman A.A., Amer H.H., Osman M. A., Dahshan A., Radiation Effects & Defects in Solids 159 (2004), 659. http://dx.doi.org/10.1080/1042015041233133595810.1080/10420150412331335958Search in Google Scholar

[10] Lucas P., Doraiswamy A., King E. A., J. Non-Cryst. Solids 332 (2003), 35. http://dx.doi.org/10.1016/j.jnoncrysol.2003.09.00810.1016/j.jnoncrysol.2003.09.008Search in Google Scholar

[11] Ganjoo A., Shimawawa K., Kamiya H., Davias E. A., SINGH J., Phys. Rev. B 62 (2000), 601. http://dx.doi.org/10.1103/PhysRevE.62.60110.1103/PhysRevE.62.601Search in Google Scholar

[12] Ganjoo A., Shimawawa K., Kitano H., Davias E. A., Singh J., J. Non-Cryst. Solids 299 (2002), 917. http://dx.doi.org/10.1016/S0022-3093(01)00991-710.1016/S0022-3093(01)00991-7Search in Google Scholar

[13] Nagels P., Mertens R., Tichy L., Mater. Lett. 57 (2003), 2494. http://dx.doi.org/10.1016/S0167-577X(02)01300-910.1016/S0167-577X(02)01300-9Search in Google Scholar

[14] Nagels P., Tichy L., Sleecks E., Callaerts R., J. Non-Cryst. Solids 230 (1998), 705. http://dx.doi.org/10.1016/S0022-3093(98)00340-810.1016/S0022-3093(98)00340-8Search in Google Scholar

[15] Ohta T., Akahira N., Ohara S., Satoh I., Optoelectronics 10 (1995), 361. Search in Google Scholar

[16] Nakamura M., Wang Y., Matsuda O., Inoue K., Murase K., J. Non-Cryst. Solids 198–200 (1996), 740. http://dx.doi.org/10.1016/0022-3093(96)00127-510.1016/0022-3093(96)00127-5Search in Google Scholar

[17] Solis J., Afonso C.N., Hyde S.C.W., Barry N.P., Frech P.M.W., Phys. Rev. Lett. 76 (1996), 2519. http://dx.doi.org/10.1103/PhysRevLett.76.251910.1103/PhysRevLett.76.2519Search in Google Scholar

[18] Lee M.-C., Tseng C.-J., Huang C.-R., Huang T.-H., Japan. J. Appl. Phys. 26 (1987), 193. http://dx.doi.org/10.1143/JJAP.26.19310.1143/JJAP.26.193Search in Google Scholar

[19] Abu El-Fadl A., Mohamed G. A., Abd El-Moiez A. B., and Rashad M., Physica B 366 (2005), 44. http://dx.doi.org/10.1016/j.physb.2005.05.01910.1016/j.physb.2005.05.019Search in Google Scholar

[20] Khan Shamshad A., Zulfequar M., Husain M., Current Applied Physics 5 (2005), 583. http://dx.doi.org/10.1016/j.cap.2004.07.00210.1016/j.cap.2004.07.002Search in Google Scholar

[21] Tauc J., in: Tauc J. (Ed.), Amorphous and Liquid Semiconductors, Plenum Press, New York, (1979), 159. Search in Google Scholar

[22] Urbach F., Phys. Rev. 92 (1953), 1324. http://dx.doi.org/10.1103/PhysRev.92.132410.1103/PhysRev.92.1324Search in Google Scholar

[23] Naik R., Jain A., Ganesan R., Sangunni K.S., Thin Solid Films 520 (2012), 2510. http://dx.doi.org/10.1016/j.tsf.2011.10.02910.1016/j.tsf.2011.10.029Search in Google Scholar

[24] el Zawawi I. K. and Abdalla R. A., Thin Solid Films 339 (1999), 314. http://dx.doi.org/10.1016/S0040-6090(98)01324-810.1016/S0040-6090(98)01324-8Search in Google Scholar

[25] Bloking J.T., Krishnaswami S., Jain H., Vlcek M., Vinci R.P., Optical Materials 17 (2001), 453. http://dx.doi.org/10.1016/S0925-3467(01)00068-410.1016/S0925-3467(01)00068-4Search in Google Scholar

[26] Mikla V.I., Mikhalko I.P., J. Non-Cryst. Solids 180 (1995), 236. http://dx.doi.org/10.1016/0022-3093(94)00455-210.1016/0022-3093(94)00455-2Search in Google Scholar

[27] Agrahari S.K., Dwivedi P.K., Kumar A., Physica B 256 (1996), 345. http://dx.doi.org/10.1016/0921-4526(96)00470-X10.1016/0921-4526(96)00470-XSearch in Google Scholar

[28] Tanaka K., J. Non-Cryst. Solids 35 (1980), 1023. http://dx.doi.org/10.1016/0022-3093(80)90335-X10.1016/0022-3093(80)90335-XSearch in Google Scholar

[29] Tanaka K., Rev. Solid State Sci. 4 (1990), 641. Search in Google Scholar

[30] Shimakawa K., Kolobov A.V., Elliott S.R., Adv. Phys. 44 (1995), 475. http://dx.doi.org/10.1080/0001873950010157610.1080/00018739500101576Search in Google Scholar

[31] Ikeda Y., Shimakawa K., J. Non-Cryst. Solids 352 (2006), 1582. http://dx.doi.org/10.1016/j.jnoncrysol.2005.12.03410.1016/j.jnoncrysol.2005.12.034Search in Google Scholar

[32] Mori T., Shimakawa K., Philos. Mag. Lett. 88 (2008), 453. http://dx.doi.org/10.1080/0950083080217531110.1080/09500830802175311Search in Google Scholar

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