1. bookVolume 31 (2013): Issue 1 (January 2013)
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
access type Open Access

CuO as sintering additive to Sr0.4Ca0.6La4Ti5O17 ceramics

Published Online: 09 Feb 2013
Volume & Issue: Volume 31 (2013) - Issue 1 (January 2013)
Page range: 122 - 125
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

The effects of CuO addition on the sintering behavior and microwave dielectric properties of Sr0.4Ca0.6La4Ti5O17 ceramics were investigated. CuO was selected as a liquid phase sintering aid to lower the sintering temperature of Sr0.4Ca0.6La4Ti5O17 ceramics. With CuO addition, the sintering temperature of Sr0.4Ca0.6La4Ti5O17 ceramics was effectively reduced from 1550 °C to 1475 °C. The crystalline phase exhibited no phase difference and no second phase was detected at all addition levels. The electric permittivity was not significantly affected by various amounts of CuO addition and ranged from 52 to 54. Small values (<+7 ppm/K) of the temperature coefficient of resonant frequency were obtained for Sr0.4Ca0.6La4Ti5O17 ceramics. However, the unloaded quality factor Q u was strongly dependent upon the CuO concentration. Q u f o ∼ 10500 GHz was obtained for Sr0.4Ca0.6La4Ti5O17 ceramics with 0.5 wt.% of CuO addition, sintered at 1475 °C.

Keywords

[1] Ouchi H., Kawashima S., Jpn. J. Appl. Phys., 24(2) (1985), 60. http://dx.doi.org/10.1143/JJAP.24.L23510.1143/JJAP.24.L235Search in Google Scholar

[2] Wakino K., Nishikawa T., Ishikawa Y., Tamura H., Br. Ceram. Trans., 39 (1990), 89. Search in Google Scholar

[3] Sreemoolanadhan H., Sebastian M.T., Mohanan P., Mater. Res. Bull., 30(6) (1995), 653. http://dx.doi.org/10.1016/0025-5408(95)00070-410.1016/0025-5408(95)00070-4Search in Google Scholar

[4] Ovchar O., Durylin D., Belous A., Jancar B., Kolodiazhnyi., Mater. Sci. Poland., 29(1) (2011), 56. http://dx.doi.org/10.2478/s13536-011-0010-z10.2478/s13536-011-0010-zSearch in Google Scholar

[5] Kim D.W., Kim J.R., Yoon S.H., Hong K.S., Kim C.K., J. Am. Ceram. Soc., 85(11) (2002), 2759. http://dx.doi.org/10.1111/j.1151-2916.2002.tb00525.x10.1111/j.1151-2916.2002.tb00525.xSearch in Google Scholar

[6] Lim J.B., Jeong Y.H., Nguyen N.H., Nahm S., Paik J.H., Kim J.H., Lee H.J., J. Eur. Ceram. Soc., 27 (2007), 2875. http://dx.doi.org/10.1016/j.jeurceramsoc.2006.11.04310.1016/j.jeurceramsoc.2006.11.043Search in Google Scholar

[7] Tzou W.C., Yang C.F., Chen Y.C., Cheng P.S., J. Eur. Ceram. Soc., 20 (2000), 991. http://dx.doi.org/10.1016/S0955-2219(99)00228-910.1016/S0955-2219(99)00228-9Search in Google Scholar

[8] Kang D.H., Nam K.C., Cha H.J., J. Eur. Ceram. Soc., 21 (2006), 1726. Search in Google Scholar

[9] Jacob M.V., Pamu D., Raju K.C.J., J. Am. Ceram. Soc., 90(5) (2007), 1511. http://dx.doi.org/10.1111/j.1551-2916.2007.01638.x10.1111/j.1551-2916.2007.01638.xSearch in Google Scholar

[10] Jawahar I.N., Santha N., Sebastian M.T., J. Mater. Res., 17(2002), 3084. http://dx.doi.org/10.1557/JMR.2002.044610.1557/JMR.2002.0446Search in Google Scholar

[11] Zhao Z., Yue Z., Gui, Li L., J. Am. Ceram. Soc., 89(11) (2006), 3421. http://dx.doi.org/10.1111/j.1551-2916.2006.01236.x10.1111/j.1551-2916.2006.01236.xSearch in Google Scholar

[12] Chen Y.C., Tsai J.M., Jpn. J. Appl. Phys., 47 (2008), 7959. http://dx.doi.org/10.1143/JJAP.47.795910.1143/JJAP.47.7959Search in Google Scholar

[13] Iqbal Y., Manan A., Reaney I.M., Mater. Res. Bull., 46(7) (2011), 1092. http://dx.doi.org/10.1016/j.materresbull.2011.03.00210.1016/j.materresbull.2011.03.002Search in Google Scholar

[14] Krupka J., Derzakowski K., Riddle B., Jarvis J.B., Meas. Sci. Technol., 9 (1998), 1751. http://dx.doi.org/10.1088/0957-0233/9/10/01510.1088/0957-0233/9/10/015Search in Google Scholar

[15] Shannan R.D., Acta Cryst. A32, (1976), 751. 10.1107/S0567739476001551Search in Google Scholar

[16] Wu L., Yang C.F.T.S., Wu T.S., J. Mater. Sci. Mater. Electron., 3 (1992), 272. http://dx.doi.org/10.1007/BF0070304010.1007/BF00703040Search in Google Scholar

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