1. bookVolume 50 (2020): Issue 3 (October 2020)
Journal Details
License
Format
Journal
eISSN
2083-4608
First Published
26 Feb 2008
Publication timeframe
4 times per year
Languages
English
access type Open Access

Reliability Determination of Nanoelectronic Devices Using Semi-Marcov Processes

Published Online: 20 Oct 2020
Volume & Issue: Volume 50 (2020) - Issue 3 (October 2020)
Page range: 277 - 296
Journal Details
License
Format
Journal
eISSN
2083-4608
First Published
26 Feb 2008
Publication timeframe
4 times per year
Languages
English
Abstract

The main purpose of the article is to investigate the reliability process of nanoelectronics devices. Firstly, the research problem is presented based on foreign data source. Then, the analytical method has been chosen – semi-Marcov processes. Next, according to the adopted method and input data, the operating process has been analyzed. Finally, the probabilities of objects being in particular operating states, e.g. in the state of failure-free operation have been determined.

Keywords

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