1. bookVolume 45 (2018): Issue 1 (March 2018)
Journal Details
License
Format
Journal
eISSN
2083-4608
First Published
26 Feb 2008
Publication timeframe
4 times per year
Languages
English
access type Open Access

Laboratory Station for Reliability Testing of Digital Circuits Using Signature Analysis

Published Online: 29 Oct 2018
Volume & Issue: Volume 45 (2018) - Issue 1 (March 2018)
Page range: 165 - 182
Journal Details
License
Format
Journal
eISSN
2083-4608
First Published
26 Feb 2008
Publication timeframe
4 times per year
Languages
English
Abstract

The article presented a laboratory station for diagnosing the digital circuits and the test results on the basis of a selected example. The idea of a response compression technique, which is called an analysis of signatures, was demonstrated. The main element of the station includes 8-bit programme of an analyser of signatures, which was developed by the authors, and implemented in the LabVIEW environment with the use of NI 6008 data analysis module. The programme operation was tested on the selected digital circuit, and the obtained results were provided in the article.

Keywords

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[7] Wang, Francis. “BIST using pseudorandom test vectors and signature analysis.” Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988. IEEE, 1988.Search in Google Scholar

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